提升专用集成电路可靠性的内在质量评价方法

徐　丹，贾　珣，王　欣，傅　倩，贾　巍

（中国兵器工业计算机应用技术研究所车辆综合电子系统研发部，北京　100089）

摘　要：随着科学技术的发展，集成电路的应用越来越广泛，其可靠性成为制约我国装备质量的一项重要因素，失效分析是集成电路可靠性及质量保证的重要环节。介绍了目前评价元器件质量的传统方法及存在的问题，提出了控制软件开发和硬件设计过程、生产和工艺过程的方法，得到更稳定的产品成品率，从而进行专用元器件内在质量评价，提高专用集成电路的可靠性。

关键词：专用集成电路；质量；可靠性

中图分类号：TN791，TP311.5　文献标志码：A

作者简介：徐丹（1988—），女，硕士研究生，E-mail：anfeng141＠126.com。(www.xing528.com)

Intrinsic quality assessment and reliability improvement of ASIC

XU Dan，JIA Xun，WANG Xin，FU Qian，JIA Wei

（Dept.of Vehicle Electronics，Beijing Institute of Computer and Electronics Application，Beijing 100089，China）

Abstract：With the development of science and technology，there are various applications of integrated cir⁃cuits.And the reliability of integrated circuits has become an important factor restricting the quality of equipment in China.Failure analysis is an important part of integrated circuit reliability and quality assurance.The problems of current evaluation methods are introduced，and methods of controlling the software design，hardware design process，production and process engineering are brought about to get a more reliable product yield.Then the in⁃trinsic quality evaluation of special components is conducted，and the reliability of ASIC（Application Specific In⁃tegrated Circuit）is improved.

Keywords：application specific integrated circuit；quality；reliability